Built-in self-Test for micro-electrode-dot-Array digital microfluidic biochips

Zipeng Li, Kelvin Yi Tse Lai, Po Hsien Yu, Krishnendu Chakrabarty, Tsung Yi Ho, Chen Yi Lee

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

8 Scopus citations

Abstract

A digital microfluidic biochip (DMFB) is an attractive platform for immunoassays, point-of-care clinical diagnostics, DNA sequencing, and other laboratory procedures in biochemistry. However, today's DMFBs suffer from several limitations, including (i) the lack of integrated sensors for real-Time detection, (ii) constraints on droplet size and the inability to vary droplet volume in a fine-grained manner, and (iii) the need for special fabrication processes and the associated reliability/yield concerns. To overcome the above limitations, DMFBs based on a micro-electrode-dot-Array (MEDA) architecture have been proposed recently. Droplet manipulation on MEDA biochips has also been experimentally demonstrated. In order to ensure robust fluidic operations and high confidence in the outcome of biochemical experiments, MEDA biochips must be adequately tested before they can be used for bioassay execution. We present an efficient built-in self-Test (BIST) architecture for MEDA biochips. The proposed BIST architecture can effectively detect defects in a MEDA biochip, and faulty microcells can be identified. Simulation results based on HSPICE and experiments using fabricated MEDA biochips highlight the effectiveness of the proposed BIST architecture.

Original languageEnglish
Title of host publicationProceedings - 2016 IEEE International Test Conference, ITC 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781467387736
DOIs
StatePublished - 2 Jul 2016
Event47th IEEE International Test Conference, ITC 2016 - Fort Worth, United States
Duration: 15 Nov 201617 Nov 2016

Publication series

NameProceedings - International Test Conference
Volume0
ISSN (Print)1089-3539

Conference

Conference47th IEEE International Test Conference, ITC 2016
CountryUnited States
CityFort Worth
Period15/11/1617/11/16

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