TY - GEN
T1 - BSIM Industry standard compact MOSFET models
AU - Chauhan, Yogesh Singh
AU - Venugopalan, Sriram
AU - Karim, Mohammed A.
AU - Khandelwal, Sourabh
AU - Paydavosi, Navid
AU - Thakur, Pankaj
AU - Niknejad, Ali M.
AU - Hu, Chen-Ming
PY - 2012/12/14
Y1 - 2012/12/14
N2 - BSIM compact models have served industry for more than a decade starting with BSIM3 and later BSIM4 and BSIMSOI. Here we will briefly discuss the ongoing work on current and future device models in BSIM group. BSIM6 is the next generation bulk RF MOSFET Model which uses charge based core with physical models adapted from BSIM4. Model fulfills all symmetry tests and shows correct slopes for harmonics. The BSIM-CMG and BSIM-IMG are the surface potential based models for multi-gate MOSFETs. The BSIM-CMG model has been developed to model common symmetric double, triple, quadruple and surround gate MOSFET. The BSIM-IMG model has been developed to model independent double-gate MOSFET capturing threshold voltage variation with back gate bias. Models include all read device effects like SCE, DIBL, mobility degradation, poly depletion, QME etc.
AB - BSIM compact models have served industry for more than a decade starting with BSIM3 and later BSIM4 and BSIMSOI. Here we will briefly discuss the ongoing work on current and future device models in BSIM group. BSIM6 is the next generation bulk RF MOSFET Model which uses charge based core with physical models adapted from BSIM4. Model fulfills all symmetry tests and shows correct slopes for harmonics. The BSIM-CMG and BSIM-IMG are the surface potential based models for multi-gate MOSFETs. The BSIM-CMG model has been developed to model common symmetric double, triple, quadruple and surround gate MOSFET. The BSIM-IMG model has been developed to model independent double-gate MOSFET capturing threshold voltage variation with back gate bias. Models include all read device effects like SCE, DIBL, mobility degradation, poly depletion, QME etc.
UR - http://www.scopus.com/inward/record.url?scp=84870794342&partnerID=8YFLogxK
U2 - 10.1109/ESSCIRC.2012.6341249
DO - 10.1109/ESSCIRC.2012.6341249
M3 - Conference contribution
AN - SCOPUS:84870794342
SN - 9781467322126
T3 - European Solid-State Circuits Conference
SP - 30
EP - 33
BT - 2012 Proceedings of the European Solid State Circuits Conference, ESSCIRC 2012
Y2 - 17 September 2012 through 21 September 2012
ER -