BSIM-IMG: A Turnkey compact model for fully depleted technologies

Chen-Ming Hu*, Ali Niknejad, V. Sriramkumar, Darsen Lu, Yogesh Chauhan, Muhammed Kahm, Angada Sachid

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

BSIM-IMG is a Turnkey, Production Ready model Will be submitted to the CMC for standardization Physical, Scalable Core Model for FDSOI devices Plethora of Real Device Effects modeled Advanced Device Effects-Quantum, Back-gate bias, Self-heating Validated on Hardware Data from two FDSOI/UTBSOI technologies Available in major EDA tools.

Original languageEnglish
Title of host publication2012 IEEE International SOI Conference, SOI 2012
DOIs
StatePublished - 1 Dec 2012
Event2012 IEEE International SOI Conference, SOI 2012 - Napa, CA, United States
Duration: 1 Oct 20124 Oct 2012

Publication series

NameProceedings - IEEE International SOI Conference
ISSN (Print)1078-621X

Conference

Conference2012 IEEE International SOI Conference, SOI 2012
CountryUnited States
CityNapa, CA
Period1/10/124/10/12

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