Broadband characterization of miniaturized on-chip differential circuits using G-S-G probe

Hung Ta Tso*, Chien-Nan Kuo

*Corresponding author for this work

Research output: Contribution to conferencePaperpeer-review

Abstract

An approach is presented to characterize on-chip differential coplanar-strip-line (CPS) test circuits using G-S-G probes. With a symmetric duplicate of the test circuit in shunt connection, the circuit can be characterized over a wide frequency range. This method is especially effective to miniaturized circuits. A 40-GHz silicon-based filter is employed for demonstration.

Original languageEnglish
Pages139-142
Number of pages4
StatePublished - 1 Dec 2004
EventIEEE 13th Topical Meeting on Electrical Performance of Electronic Packaging - Portland, OR, United States
Duration: 25 Oct 200427 Oct 2004

Conference

ConferenceIEEE 13th Topical Meeting on Electrical Performance of Electronic Packaging
CountryUnited States
CityPortland, OR
Period25/10/0427/10/04

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