Boundary scan BIST methodology for reconfigurable systems

Chau-Chin Su*, Shung Won Jeng, Yue Tsang Chen

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Scopus citations

Abstract

The interconnect BIST is achieved by the on-line polling for the composite vectors that contain the encoded information for the test generation and response evaluation on selective drivers and receivers to adapt to the changing configuration.

Original languageEnglish
Title of host publicationIEEE International Test Conference (TC)
Editors Anon
Pages774-783
Number of pages10
DOIs
StatePublished - 1 Dec 1998
EventProceedings of the 1998 IEEE International Test Conference - Washington, DC, USA
Duration: 18 Oct 199821 Oct 1998

Publication series

NameIEEE International Test Conference (TC)
ISSN (Print)1089-3539

Conference

ConferenceProceedings of the 1998 IEEE International Test Conference
CityWashington, DC, USA
Period18/10/9821/10/98

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