Bipolar switching characteristics of low-power Geo resistive memory

C. H. Cheng, P. C. Chen, S. L. Liu, T. L. Wu, H. H. Hsu, Albert Chin, F. S. Yeh

Research output: Contribution to journalArticlepeer-review

4 Scopus citations


We reported an ultra low-power resistive random access memory (RRAM) combining a low-cost Ni electrode and covalent-bond GeO x dielectric. This cost-effective Ni/GeO x /TaN RRAM device has very small set power of 2 μW, ultra-low reset power of 130 pW, greater than 1 order of magnitude resistance window, and stable retention at 85 °C. The current flow at low-resistance state is governed by Poole-Frenkel conduction with electrons hopping via defect traps, which is quite different from the filament conduction in metal-oxide RRAM.

Original languageEnglish
Pages (from-to)90-93
Number of pages4
JournalSolid-State Electronics
Issue number1
StatePublished - 1 Aug 2011


  • Germanium oxide (GeO )
  • Resistive random access memory (RRAM)

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