@inproceedings{e43f6d7c3b1147aea04e1aa7ef2d9daf,
title = "Behavior-level yield enhancement approach for large-scaled analog circuits",
abstract = "In traditional yield enhancement approaches, a lot of computation efforts have to be paid first to find the feasible regions and the Pareto fronts, which will become a heavy cost for large analog circuits. In order to reduce the computation efforts, this work tries to finish all iteration steps of the yield enhancement flow at behavior level. First, a novel force-directed nominal point moving (NPM) algorithm is proposed to find a better nominal point without building the feasible regions. Then, an equation-based behavior-level sizing approach is proposed to map the NPM results at performance level to behavior-level parameters. A fast behavior-level Monte Carlo simulation is also proposed to shorten the iterative yield enhancement flow. Finally, using the obtained behavioral parameters as the sizing targets of each sub-block, the device sizing time is significantly reduced instead of sizing from the system-level specifications directly. As demonstrated on a complex CPPLL design, this behavior-level approach could be another efficient methodology to help designers improve their analog circuits toward better yield.",
keywords = "Analog circuits, Process variation, Yield enhancement",
author = "Kuo, {Chin Cheng} and Chen, {Yen Lung} and Tsai, {I. Ching} and Chan, {Li Yu} and Chien-Nan Liu",
year = "2010",
month = sep,
day = "7",
doi = "10.1145/1837274.1837501",
language = "English",
isbn = "9781450300025",
series = "Proceedings - Design Automation Conference",
pages = "903--908",
booktitle = "Proceedings of the 47th Design Automation Conference, DAC '10",
note = "null ; Conference date: 13-06-2010 Through 18-06-2010",
}