Automatic Defense through Fault Localization and Dynamic Patch Creation

Hsia Hsiang Chen, Da Qun Zheng, Shih-Kun Huang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

The US Department of Defense has called for contest on automatic attack and defense. The contest is a competition, called Cyber Grand Challenge (CGC), aimed at developing cyber security systems. In accordance with the competition rules, we developed an automatic cyber reasoning system (CRS) that meets the objectives specified in the CGC. Our CRS combines the techniques of fuzz testing, fault localization, and binary patch creation to construct an automatic defense system. From the sample problems in the CGC, we evaluate our system and the binary patch capability by applying them to real programs. We explore two patching methods in five challenges in CGC with partial successes in availability and security.

Original languageEnglish
Title of host publicationProceedings - 2016 IEEE International Conference on Software Quality, Reliability and Security-Companion, QRS-C 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages408-409
Number of pages2
ISBN (Electronic)9781509037131
DOIs
StatePublished - 21 Sep 2016
Event2nd IEEE International Conference on Software Quality, Reliability and Security-Companion, QRS-C 2016 - Vienna, Austria
Duration: 1 Aug 20163 Aug 2016

Publication series

NameProceedings - 2016 IEEE International Conference on Software Quality, Reliability and Security-Companion, QRS-C 2016

Conference

Conference2nd IEEE International Conference on Software Quality, Reliability and Security-Companion, QRS-C 2016
CountryAustria
CityVienna
Period1/08/163/08/16

Keywords

  • Cyber Grand Challenge (CGC)
  • binary patch
  • cyber reasoning system (CRS)
  • fault localization
  • fuzz testing

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