Automatic circuit sizing technique for the analog circuits with flexible TFTs considering process variation and bending effects

Yen Lung Chen, Wan Rong Wu, Guan Ruei Lu, Chien-Nan Liu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

Flexible electronics are possible alternative for portable consumer applications with many advantages. However, the circuit design for flexible electronics is still challenging, especially for sensitive analog circuits. Significant parameter variations and bending effects of flexible TFTs further increase the difficulties for circuit designers. In this paper, an automatic circuit sizing technique is proposed for the analog circuits with flexible TFTs. The process variation and bending effects of flexible TFTs are considered simultaneously in the optimization flow. As shown in the experimental results, the proposed approach can further improve the design yield and significantly reduce the design overhead.

Original languageEnglish
Title of host publicationProceedings - Design, Automation and Test in Europe, DATE 2013
Pages1458-1461
Number of pages4
DOIs
StatePublished - 21 Oct 2013
Event16th Design, Automation and Test in Europe Conference and Exhibition, DATE 2013 - Grenoble, France
Duration: 18 Mar 201322 Mar 2013

Publication series

NameProceedings -Design, Automation and Test in Europe, DATE
ISSN (Print)1530-1591

Conference

Conference16th Design, Automation and Test in Europe Conference and Exhibition, DATE 2013
CountryFrance
CityGrenoble
Period18/03/1322/03/13

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  • Cite this

    Chen, Y. L., Wu, W. R., Lu, G. R., & Liu, C-N. (2013). Automatic circuit sizing technique for the analog circuits with flexible TFTs considering process variation and bending effects. In Proceedings - Design, Automation and Test in Europe, DATE 2013 (pp. 1458-1461). [6513743] (Proceedings -Design, Automation and Test in Europe, DATE). https://doi.org/10.7873/DATE.2013.297