Auto defect detection of A-IGZO thin film transistor backplane on foldable medical array panel application

Yu Min Hung, Yao Chin Wang*, Yu Ching Yang, Bor Shyh Lin, Bor Shing Lin

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This article reported on the pixel flaw detection properties of amorphous In-Ga-Zn-O-based active thin film transistors on flexible medical panel substrate application, which is using the non-invasive optoelectronic transforming inspection technique. The experimental data exactly showed good flaw detection rate > 90% and stable uniformity < 5%. Currently, it is a popular method with electrical testing and detection with advantages of ultrahigh resolution and small-pixel-sized medical panel, and no contact damaged to the application of flexible medical panel substrates.

Original languageEnglish
Title of host publicationProceedings of Computing Conference 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1423-1425
Number of pages3
ISBN (Electronic)9781509054435
DOIs
StatePublished - 8 Jan 2018
Event2017 SAI Computing Conference 2017 - London, United Kingdom
Duration: 18 Jul 201720 Jul 2017

Publication series

NameProceedings of Computing Conference 2017
Volume2018-January

Conference

Conference2017 SAI Computing Conference 2017
CountryUnited Kingdom
CityLondon
Period18/07/1720/07/17

Keywords

  • a-IGZO
  • detection
  • foldable medical array panel
  • thin film transistor

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  • Cite this

    Hung, Y. M., Wang, Y. C., Yang, Y. C., Lin, B. S., & Lin, B. S. (2018). Auto defect detection of A-IGZO thin film transistor backplane on foldable medical array panel application. In Proceedings of Computing Conference 2017 (pp. 1423-1425). (Proceedings of Computing Conference 2017; Vol. 2018-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SAI.2017.8252282