Approaches to statistical circuit analysis for deep sub-micron technologies

Michael Orshansky*, James C. Chen, Chen-Ming Hu, Daniel Wan, Peter Bendix

*Corresponding author for this work

Research output: Contribution to conferencePaperpeer-review

1 Scopus citations

Abstract

Difficulties of statistical circuit analysis for deep sub-micron CMOS technologies are discussed. The observed complex patterns of variation in device parameters make previously used methods invalid. An approach that couples the extracted SPICE parameter sets with their physical locations is advocated as an alternative.

Original languageEnglish
Pages6-9
Number of pages4
DOIs
StatePublished - 1 Dec 1998
EventProceedings of the 1998 3rd Internatinal Workshop on Statistical Metrology (IWSM) - Honolulu, HI, USA
Duration: 7 Jun 19987 Jun 1998

Conference

ConferenceProceedings of the 1998 3rd Internatinal Workshop on Statistical Metrology (IWSM)
CityHonolulu, HI, USA
Period7/06/987/06/98

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