Anti-ESL/ESR variation robust constant-on-time control for DC-DC buck converter in 28nm CMOS technology

Hsin Chieh Chen, Wei Chung Chen, Ying Wei Chou, Meng Wei Chien, Chin Long Wey, Ke-Horng Chen, Ying Hsi Lin, Tsung Yen Tsai, Chao Cheng Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

Conventional constant-on-time (COT) control for DC-DC buck converter is apt to be affected by the noise caused by parasitic effect including not properly specified and temperature dependent equivalent series resistance (ESR) and equivalent series inductance (ESL). As a result, the safety operation area (SOA) of the COT is limited by the selection of external components. In this paper, the calibrated anti-ESL (CAESL) technique and the calibrated gain and BW (CGB) technique for alleviating ESL and ESR variation, respectively, are proposed to ensure a robust COT control. Furthermore, degraded output regulation caused by enlarged ESL effect due to input battery voltage variation is also solved by the CAESL technique. The proposed COT converter fabricated in 28nm CMOS technology uses an output capacitor with an ESR smaller than 1m, output ripple of 20mV, and high efficiency higher than 95%. The CAESL circuit can tolerate ESL voltage variation from 0 to 50mV even when operation temperature varies from -40 to 120°C.

Original languageEnglish
Title of host publicationProceedings of the IEEE 2014 Custom Integrated Circuits Conference, CICC 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781479932863
DOIs
StatePublished - 4 Nov 2014
Event36th Annual Custom Integrated Circuits Conference - The Showcase for Integrated Circuit Design in the Heart of Silicon Valley, CICC 2014 - San Jose, United States
Duration: 15 Sep 201417 Sep 2014

Publication series

NameProceedings of the IEEE 2014 Custom Integrated Circuits Conference, CICC 2014

Conference

Conference36th Annual Custom Integrated Circuits Conference - The Showcase for Integrated Circuit Design in the Heart of Silicon Valley, CICC 2014
CountryUnited States
CitySan Jose
Period15/09/1417/09/14

Keywords

  • calibrated anti-ESL (CAESL)
  • calibrated gain and BW (CGB)
  • equivalent series inductor (ESL)
  • equivalent series resistance (ESR)

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    Chen, H. C., Chen, W. C., Chou, Y. W., Chien, M. W., Wey, C. L., Chen, K-H., Lin, Y. H., Tsai, T. Y., & Lee, C. C. (2014). Anti-ESL/ESR variation robust constant-on-time control for DC-DC buck converter in 28nm CMOS technology. In Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, CICC 2014 [6946134] (Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, CICC 2014). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CICC.2014.6946134