Anisotropic structure induced electrical properties of a-plane InN

P. H. Chang, J. W. Chia, S. Gwo, Hyeyoung Ahn

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Terahertz spectroscopy reveals that the anisotropic electrical properties of nonpolar InN film along in-plane c-axis and in-plane m-axis are determined by the orientation of narrow and thin stacking faults, not by the density of defects.

Original languageEnglish
Title of host publication2013 Conference on Lasers and Electro-Optics, CLEO 2013
Subtitle of host publicationQELS_Fundamental Science, CLEO:QELS FS 2013
PublisherIEEE Computer Society
ISBN (Print)9781557529725
DOIs
StatePublished - 1 Jan 2013
Event2013 Conference on Lasers and Electro-Optics, CLEO 2013 - San Jose, CA, United States
Duration: 9 Jun 201314 Jun 2013

Publication series

Name2013 Conference on Lasers and Electro-Optics, CLEO 2013

Conference

Conference2013 Conference on Lasers and Electro-Optics, CLEO 2013
CountryUnited States
CitySan Jose, CA
Period9/06/1314/06/13

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