Analysis of application of the IDDQ technique to the deep sub-micron VLSI testing

Chih Wen Lu, Chung Len Lee, Chauchin Su, Jwu E. Chen

Research output: Contribution to journalArticle

1 Scopus citations

Fingerprint Dive into the research topics of 'Analysis of application of the IDDQ technique to the deep sub-micron VLSI testing'. Together they form a unique fingerprint.

Engineering & Materials Science