@inproceedings{792f9cdd14954ce9895acb6e1667439e,
title = "Analysis and modeling of skin and proximity effects for millimeter-wave inductors design in nanoscale Si CMOS",
abstract = "Analytical models of skin effect and proximity effect were developed in this paper to calculate and predict the frequency dependent resistance, Re(Zin) and Q for mm-wave inductor design. The derived models incorporate layout and material parameters, and frequency in an explicit form suitable for circuit simulation. The accuracy has been proven by a close match with Re(Zin) and Q measured from mm-wave inductor (Ldc∼150pH, Qmax ∼17, fSR>>65GHz) fabricated by 65nm CMOS process with 0.9μm standard top metal.",
keywords = "Analytical model, CMOS, mm-wave inductor, proximity, skin",
author = "Chan, {Ren Jia} and Jyh-Chyurn Guo",
year = "2014",
month = dec,
day = "23",
doi = "10.1109/EuMIC.2014.6997779",
language = "English",
series = "European Microwave Week 2014: {"}Connecting the Future{"}, EuMW 2014 - Conference Proceedings; EuMIC 2014: 9th European Microwave Integrated Circuits Conference",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "13--16",
booktitle = "European Microwave Week 2014",
address = "United States",
note = "null ; Conference date: 06-10-2014 Through 07-10-2014",
}