Analysis and modeling of skin and proximity effects for millimeter-wave inductors design in nanoscale Si CMOS

Ren Jia Chan, Jyh-Chyurn Guo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Scopus citations

Abstract

Analytical models of skin effect and proximity effect were developed in this paper to calculate and predict the frequency dependent resistance, Re(Zin) and Q for mm-wave inductor design. The derived models incorporate layout and material parameters, and frequency in an explicit form suitable for circuit simulation. The accuracy has been proven by a close match with Re(Zin) and Q measured from mm-wave inductor (Ldc∼150pH, Qmax ∼17, fSR>>65GHz) fabricated by 65nm CMOS process with 0.9μm standard top metal.

Original languageEnglish
Title of host publicationEuropean Microwave Week 2014
Subtitle of host publication"Connecting the Future", EuMW 2014 - Conference Proceedings; EuMIC 2014: 9th European Microwave Integrated Circuits Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages13-16
Number of pages4
ISBN (Electronic)9782874870361
DOIs
StatePublished - 23 Dec 2014
Event9th European Microwave Integrated Circuits Conference, EuMIC 2014 - Held as Part of the 17th European Microwave Week, EuMW 2014 - Rome, Italy
Duration: 6 Oct 20147 Oct 2014

Publication series

NameEuropean Microwave Week 2014: "Connecting the Future", EuMW 2014 - Conference Proceedings; EuMIC 2014: 9th European Microwave Integrated Circuits Conference

Conference

Conference9th European Microwave Integrated Circuits Conference, EuMIC 2014 - Held as Part of the 17th European Microwave Week, EuMW 2014
CountryItaly
CityRome
Period6/10/147/10/14

Keywords

  • Analytical model
  • CMOS
  • mm-wave inductor
  • proximity
  • skin

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    Chan, R. J., & Guo, J-C. (2014). Analysis and modeling of skin and proximity effects for millimeter-wave inductors design in nanoscale Si CMOS. In European Microwave Week 2014: "Connecting the Future", EuMW 2014 - Conference Proceedings; EuMIC 2014: 9th European Microwave Integrated Circuits Conference (pp. 13-16). [6997779] (European Microwave Week 2014: "Connecting the Future", EuMW 2014 - Conference Proceedings; EuMIC 2014: 9th European Microwave Integrated Circuits Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EuMIC.2014.6997779