Analysis and modeling of inner fringing field effect on negative capacitance FinFETs

Yen Kai Lin*, Harshit Agarwal, Pragya Kushwaha, Ming Yen Kao, Yu Hung Liao, Korok Chatterjee, Sayeef Salahuddin, Chen-Ming Hu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

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Chemical Compounds

Engineering & Materials Science