Analog signal metrology for mixed signal ICs

Chau-Chin Su*, Yi Ren Cheng, Yue Tsang Chen, Shing Tenchen

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

Abstract

Signal reconstruction reconstructs a multiple-period low-rate sampled waveform into a one-period high-rate sampled waveform. With which, we are able to provide sufficient samples of analog signals for DSP based testing using on-chip ADCs. Test results show that a 128-sample-per-period waveform can be reconstructed from a 2.4 samples per period waveform sampled by a 20 MHz 8-bit ADC.

Original languageEnglish
Pages (from-to)194-199
Number of pages6
JournalProceedings of the Asian Test Symposium
DOIs
StatePublished - 1 Dec 1997
EventProceedings of the 1997 6th Asian Test Symposium - Akita, Jpn
Duration: 17 Nov 199719 Nov 1997

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