Abstract
This paper presents a metrology to extent P1149.4 from external component testing for internal module measurement. A series of experiment has been conducted to verify that the metrology is able to tolerate parasitic effects and test signal variation. As compare to the direct measurement, the metrology achieves an improvement of 14 dB in measurement SNR. Further more, it also extends the frequency range by one order.
Original language | English |
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Pages (from-to) | 378-382 |
Number of pages | 5 |
Journal | Proceedings of the Asian Test Symposium |
State | Published - 1 Dec 1998 |
Event | Proceedings of the 1998 7th Asian Test Symposium - Singapore, Singapore Duration: 2 Dec 1998 → 4 Dec 1998 |