Analog module metrology using MNABST-1 P1149.4 test chip

Yue Tsang Chen*, Chau-Chin Su

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

Abstract

This paper presents a metrology to extent P1149.4 from external component testing for internal module measurement. A series of experiment has been conducted to verify that the metrology is able to tolerate parasitic effects and test signal variation. As compare to the direct measurement, the metrology achieves an improvement of 14 dB in measurement SNR. Further more, it also extends the frequency range by one order.

Original languageEnglish
Pages (from-to)378-382
Number of pages5
JournalProceedings of the Asian Test Symposium
StatePublished - 1 Dec 1998
EventProceedings of the 1998 7th Asian Test Symposium - Singapore, Singapore
Duration: 2 Dec 19984 Dec 1998

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