Analog module metrology using MNABST-1 P1149.4 test chip

Yue Tsang Chen; Chau-Chin Su

Analog module metrology using MNABST-1 P1149.4 test chip

Yue Tsang Chen^*, Chau-Chin Su

^*Corresponding author for this work

Department of Electrical and Computer Engineering

Research output: Contribution to journal › Conference article › peer-review

Abstract

This paper presents a metrology to extent P1149.4 from external component testing for internal module measurement. A series of experiment has been conducted to verify that the metrology is able to tolerate parasitic effects and test signal variation. As compare to the direct measurement, the metrology achieves an improvement of 14 dB in measurement SNR. Further more, it also extends the frequency range by one order.

Original language	English
Pages (from-to)	378-382
Number of pages	5
Journal	Proceedings of the Asian Test Symposium
State	Published - 1 Dec 1998
Event	Proceedings of the 1998 7th Asian Test Symposium - Singapore, Singapore Duration: 2 Dec 1998 → 4 Dec 1998

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title = "Analog module metrology using MNABST-1 P1149.4 test chip",

abstract = "This paper presents a metrology to extent P1149.4 from external component testing for internal module measurement. A series of experiment has been conducted to verify that the metrology is able to tolerate parasitic effects and test signal variation. As compare to the direct measurement, the metrology achieves an improvement of 14 dB in measurement SNR. Further more, it also extends the frequency range by one order.",

author = "Chen, {Yue Tsang} and Chau-Chin Su",

year = "1998",

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day = "1",

language = "English",

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journal = "Proceedings of the Asian Test Symposium",

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publisher = "IEEE Computer Society",

note = "null ; Conference date: 02-12-1998 Through 04-12-1998",

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AU - Su, Chau-Chin

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N2 - This paper presents a metrology to extent P1149.4 from external component testing for internal module measurement. A series of experiment has been conducted to verify that the metrology is able to tolerate parasitic effects and test signal variation. As compare to the direct measurement, the metrology achieves an improvement of 14 dB in measurement SNR. Further more, it also extends the frequency range by one order.

AB - This paper presents a metrology to extent P1149.4 from external component testing for internal module measurement. A series of experiment has been conducted to verify that the metrology is able to tolerate parasitic effects and test signal variation. As compare to the direct measurement, the metrology achieves an improvement of 14 dB in measurement SNR. Further more, it also extends the frequency range by one order.

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M3 - Conference article

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SP - 378

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JO - Proceedings of the Asian Test Symposium

JF - Proceedings of the Asian Test Symposium

SN - 1081-7735

Y2 - 2 December 1998 through 4 December 1998

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