Analog metrology and stimulus selection in a noisy environment

Chau-Chin Su*, Yue Tsang Chen, Chung Len Lee

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

Abstract

In this paper, an analog metrology and test stimulus selection guidelines are proposed based on the frequency domain analysis of the stimulus and the CUT. To show the feasibility, a 4th order leapfrog filter and a DSP deconvolution operation are used as the test vehicle. The experimental results on the real measured data show that the increase in observation periods can effectively compensate the increase in the environment noise.

Original languageEnglish
Pages (from-to)233-238
Number of pages6
JournalProceedings of the Asian Test Symposium
DOIs
StatePublished - 1 Dec 1999
EventProceedings of the 1999 8th Asian Test Symposium (ATS'99) - Shanghai, China
Duration: 16 Nov 199918 Nov 1999

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