An X-Ray Study of Domain Structure and Stress in Pd2Si Films at Pd-Si Interfaces

Haydn Chen*, G. E. White, S. R. Stock, P. S. Ho

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations
Original languageEnglish
Title of host publicationMaterials Research Society Symposia Proceedings
PublisherNorth-Holland Publ Co
Pages165-117
Number of pages49
ISBN (Print)0444007741
DOIs
StatePublished - 1 Dec 1982

Publication series

NameMaterials Research Society Symposia Proceedings
Volume10
ISSN (Print)0272-9172

Cite this

Chen, H., White, G. E., Stock, S. R., & Ho, P. S. (1982). An X-Ray Study of Domain Structure and Stress in Pd2Si Films at Pd-Si Interfaces. In Materials Research Society Symposia Proceedings (pp. 165-117). (Materials Research Society Symposia Proceedings; Vol. 10). North-Holland Publ Co. https://doi.org/10.1557/PROC-10-165