An improved approach for estimating product performance based on the capability index C pmk

W.l. Pearn, Dong Yuh Yang*, Ya Ching Cheng

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

In this article, we construct an improved procedure for estimating the process capability index C pmk. We propose a new C pmk lower-bound approach based on the GCI concept, and compare it with other existing methods. Based on the comparison results, we conclude with a recommendation, and construct a step-by-step procedure for the recommended approach to estimate the actual process capability C pmk for various sample sizes. The lower bound attended by our recommended approach, indeed, improves other existing lower bound methods. We also investigate a real-world application to illustrate how we could apply the recommended approach to the actual manufacturing processes.

Original languageEnglish
Pages (from-to)2073-2095
Number of pages23
JournalCommunications in Statistics: Simulation and Computation
Volume38
Issue number10
DOIs
StatePublished - 1 Nov 2009

Keywords

  • Confidence level
  • Coverage rate
  • Generalized confidence intervals
  • Lower confidence bound
  • Process capability index
  • Process loss
  • Process yield

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