An ILP-based diagnosis framework for multiple open-segment defects

Chen Yuan Kao*, Chien Hui Liao, Charles H.P. Wen

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

The faulty behavior of an open defect is determined by Byzantine effect and physical routing. Byzantine effect makes the such faulty behaviors non-deterministic and therefore, ATPG has difficulty on the fault activation and propagation which depend on both the pattern and the physical information. This paper proposes a three-stage diagnosis approach of finding combinations of open-segment defects. Path tracing extracts all candidate fault sites from error outputs of failing patterns. An ILP solver enumerates all fault combinations by considering fault candidates and simulation responses. Last, fault simulation identifies true open-segment faults by pruning false cases. Experimental results shows the resolution of the proposed approach is high and only generates <9 combination for all ISCAS 85 circuits under 1 to 5 open-segment defects.

Original languageEnglish
Title of host publication10th International Workshop on Microprocessor Test and Verification
Subtitle of host publicationCommon Challenges and Solutions, MTV 2009
Pages69-72
Number of pages4
DOIs
StatePublished - 1 Dec 2009
Event10th International Workshop on Microprocessor Test and Verification: Common Challenges and Solutions, MTV 2009 - Austin, TX, United States
Duration: 7 Dec 20099 Dec 2009

Publication series

NameProceedings - International Workshop on Microprocessor Test and Verification
ISSN (Print)1550-4093

Conference

Conference10th International Workshop on Microprocessor Test and Verification: Common Challenges and Solutions, MTV 2009
CountryUnited States
CityAustin, TX
Period7/12/099/12/09

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