An Experimental Approach to Characterizing the Channel Local Temperature Induced by Self-Heating Effect in FinFET

E. Ray Hsieh, Meng Ru Jiang, Jian Li Lin, Steve S. Chung*, Tse Pu Chen, Shih An Huang, Tai Ju Chen, Osbert Cheng

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

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