An Automated System for Measurement of Random Telegraph Noise in Metal-Oxide-Semiconductor Field-Effect Transistors

K. K. Hung, P. K. Ko, Chen-Ming Hu

Research output: Contribution to journalArticlepeer-review

19 Scopus citations

Abstract

A computer-controlled system for measuring the random telegraph noise in the drain current of small-channel-area metal-oxide-semiconductor field-effect transistors is described. Techniques for determining the amplitude and time constants of the current fluctuations are also discussed.

Original languageEnglish
Pages (from-to)1217-1219
Number of pages3
JournalIEEE Transactions on Electron Devices
Volume36
Issue number6
DOIs
StatePublished - 1 Jan 1989

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