This paper introduces the design of a high-speed reconfigurable analog-to-digital converter in 65-nm CMOS. Accuracy requirements are met without compromising performance by means of digital calibration and smart architecture selection. Partial interleaving architecture and the introduction of a current-steering DAC and an open-loop residue amplifier are proposed to relax the MDAC settling at minimal overhead. Dynamic thresholds adjustment for the sub-ADCs is employed both to calibrate the ADC offset mismatches and to correct for the residue amplifier nonidealities. The ADC covers a resolution range from 3-b to 7-b at sampling rates from 4GS/s to 1.5GS/s. The worst case DNL and INL are ±0.45LSB and ±0.66LSB respectively. The ADC achieves a figure-of-merit of 0.46pJ/conv at 7-b and occupies an active area of 0.15mm 2.