An application of non-normal process capability indices

K. S. Chen, W.l. Pearn*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

44 Scopus citations

Abstract

Numerous process capability indices, including Cp, Cpk, Cpm, and Cpmk, have been proposed to provide measures of process potential and performance. In this paper, we consider some generalizations of these four basic indices to cover non-normal distributions. The proposed generalizations are compared with the four basic indices. The results show that the proposed generalizations are more accurate than those basic indices and other generalizations in measuring process capability. We also consider an estimation method based on sample percentiles to calculate the proposed generalizations, and give an example to illustrate how we apply the proposed generalizations to actual data collected from the factory.

Original languageEnglish
Pages (from-to)355-360
Number of pages6
JournalQuality and Reliability Engineering International
Volume13
Issue number6
DOIs
StatePublished - 1 Jan 1997

Keywords

  • Percentile
  • Process capability index
  • Process mean
  • Process standard deviation

Fingerprint Dive into the research topics of 'An application of non-normal process capability indices'. Together they form a unique fingerprint.

Cite this