All digital 625Mbps & 2.5Gbps deskew buffer design

Hung W. Lu*, Yin T. Chang, Chau-Chin Su

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

This paper describes an all digital 625Mbps and 2.5Gbps de-skew design for data recovery. It uses a confidence counter to serve as the loop filler that greatly reduces the circuit complexity and improves the jitter compression. The 625Mbps version has been implemented using TSMC 0.18um 1P6M CMOS technology. Measurement results show that the phase resolution is 100ps and the de-skew range is 1.6ns. The output jitter is 48ps and the power consumption is 3.8 mW. For the 2.5Gbps version, the simulation results show that the timing resolution is 26ps, the total de-skew range is 400ps, the output jitter is 26.5ps, and the power consumption is 16 mW.

Original languageEnglish
Title of host publication2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)
Pages263-266
Number of pages4
DOIs
StatePublished - 1 Dec 2005
Event2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT) - Hsinchu, Taiwan
Duration: 27 Apr 200529 Apr 2005

Publication series

Name2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)
Volume2005

Conference

Conference2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)
CountryTaiwan
CityHsinchu
Period27/04/0529/04/05

Fingerprint Dive into the research topics of 'All digital 625Mbps & 2.5Gbps deskew buffer design'. Together they form a unique fingerprint.

  • Cite this

    Lu, H. W., Chang, Y. T., & Su, C-C. (2005). All digital 625Mbps & 2.5Gbps deskew buffer design. In 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT) (pp. 263-266). [1500071] (2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT); Vol. 2005). https://doi.org/10.1109/VDAT.2005.1500071