Advanced soft-error-rate (ser) estimation with striking-time and multi-cycle effects

Ryan H.M. Huang, Charles H.P. Wen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Scopus citations

Abstract

Soft error rate (SER) has become a critical reliability is- sue for CMOS designs due to continuous technology scaling. However, the striking-time and multi-cycle effects have not been properly considered in SER for advanced CMOS de- signs. Therefore, in this paper, the striking-time and multi- cycle effects are formulated into the problem of SER esti- mation, and then a SER analysis framework is proposed, accordingly. Experimental results show that SERs on the benchmark circuits are seriously underestimated when ig- noring both effects. Moreover, SERs increase more on those high-performance or low-power CMOS designs. New treat- ment to SER needs to be explored in the future.

Original languageEnglish
Title of host publicationDAC 2014 - 51st Design Automation Conference, Conference Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781479930173
DOIs
StatePublished - 1 Jan 2014
Event51st Annual Design Automation Conference, DAC 2014 - San Francisco, CA, United States
Duration: 2 Jun 20145 Jun 2014

Publication series

NameProceedings - Design Automation Conference
ISSN (Print)0738-100X

Conference

Conference51st Annual Design Automation Conference, DAC 2014
CountryUnited States
CitySan Francisco, CA
Period2/06/145/06/14

Keywords

  • Soft error
  • Transient fault

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    Huang, R. H. M., & Wen, C. H. P. (2014). Advanced soft-error-rate (ser) estimation with striking-time and multi-cycle effects. In DAC 2014 - 51st Design Automation Conference, Conference Proceedings [2593081] (Proceedings - Design Automation Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1145/2593069.2593081