Advanced imaging of nanometer-scale recorded bits on super-resolution near-field optical disk

Pei Lin Yang, Pei Hsin Chang, Chih Ching Hsu, Wei Chih Lin, Tsung-Sheng Kao, Cheng Wei Lin, Din Ping Tsai

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

An advanced imaging technique is demonstrated for fast, non-destructive and high resolution characterizations for nanometer-scale recorded bits on a super-resolution near-field optical disk (super-RENS), For the first time, an array of individual 100 nm recorded marks is imaged and studied by using the conductive-atomic force microscopy (C-AFM) method. Discussions also include comparisons of 300 nm, 200 nm and 100 nm recorded marks on both a super-RENS disk and a commercial DVD disk, and the image results are evidence of the high carrier-to-noise ratio (CNR) value on the super-RENS disk, even though the mark size has been shrunk to less than the diffraction limit.

Original languageEnglish
Pages (from-to)S115-S118
JournalJournal of the Korean Physical Society
Volume47
Issue numberSUPPL. 1
StatePublished - 1 Aug 2005

Keywords

  • C-AFM
  • Near-field optics
  • Recording bit
  • Super-RENS
  • ZnO film

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