Adaptive feature selection for digital camera source identification

Min-Jen Tsai*, Cheng Sheng Wang

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Scopus citations

Abstract

Digital forensics which identifies the characteristics and the originality of the digital devices has lately become one of the very important applications. If it wants to serve as the evidence to the court like its traditional counterparts, the digital forensics issues like verifying the authenticity of digital image, detecting the forged regions or identifying digital camera source of an image will need to be addressed. This study has focused on analyzing the relationship between digital cameras and the photographs by using the support vector machine (SVM). In this paper, several feature selection algorithms will be implemented with SVM-based classifier to increase the predicting accuracy rate of identifying digital camera source of an image. The experiment results demonstrate that our adaptive feature selection scheme can achieve higher identification rate for unbiased camera sources than the results without using feature selection approaches.

Original languageEnglish
Title of host publication2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008
Pages412-415
Number of pages4
DOIs
StatePublished - 19 Sep 2008
Event2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008 - Seattle, WA, United States
Duration: 18 May 200821 May 2008

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
ISSN (Print)0271-4310

Conference

Conference2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008
CountryUnited States
CitySeattle, WA
Period18/05/0821/05/08

Keywords

  • Correlation
  • Feature selection
  • Image quality metrics
  • Supporting vector machine

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    Tsai, M-J., & Wang, C. S. (2008). Adaptive feature selection for digital camera source identification. In 2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008 (pp. 412-415). [4541442] (Proceedings - IEEE International Symposium on Circuits and Systems). https://doi.org/10.1109/ISCAS.2008.4541442