Accurate Statistical Soft Error Rate (SSER) analysis using a quasi-monte carlo framework with quality cell models

Yu Hsin Kuo*, Huan Kai Peng, Charles H.P. Wen

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

22 Scopus citations

Abstract

For CMOS designs in sub 90nm technologies, statistical methods are necessary to accurately estimate circuit SER considering process variations. However, due to the lack of quality statistical models, current statistical SER (SSER) frameworks have not yet achieved satisfactory accuracy. In this work, we present accurate table-based cell models, based on which a Monte Carlo SSER analysis framework is built. We further propose a heuristic to customize the use of quasirandom sequences, which successfully speeds up the convergence of simulation error and hence shortens the runtime. Experimental results show that this framework is capable of more precisely estimating circuit SSERs with reasonable speed.

Original languageEnglish
Title of host publicationProceedings of the 11th International Symposium on Quality Electronic Design, ISQED 2010
Pages831-838
Number of pages8
DOIs
StatePublished - 28 May 2010
Event11th International Symposium on Quality Electronic Design, ISQED 2010 - San Jose, CA, United States
Duration: 22 Mar 201024 Mar 2010

Publication series

NameProceedings of the 11th International Symposium on Quality Electronic Design, ISQED 2010

Conference

Conference11th International Symposium on Quality Electronic Design, ISQED 2010
CountryUnited States
CitySan Jose, CA
Period22/03/1024/03/10

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