TY - GEN
T1 - Accurate Statistical Soft Error Rate (SSER) analysis using a quasi-monte carlo framework with quality cell models
AU - Kuo, Yu Hsin
AU - Peng, Huan Kai
AU - Wen, Charles H.P.
PY - 2010/5/28
Y1 - 2010/5/28
N2 - For CMOS designs in sub 90nm technologies, statistical methods are necessary to accurately estimate circuit SER considering process variations. However, due to the lack of quality statistical models, current statistical SER (SSER) frameworks have not yet achieved satisfactory accuracy. In this work, we present accurate table-based cell models, based on which a Monte Carlo SSER analysis framework is built. We further propose a heuristic to customize the use of quasirandom sequences, which successfully speeds up the convergence of simulation error and hence shortens the runtime. Experimental results show that this framework is capable of more precisely estimating circuit SSERs with reasonable speed.
AB - For CMOS designs in sub 90nm technologies, statistical methods are necessary to accurately estimate circuit SER considering process variations. However, due to the lack of quality statistical models, current statistical SER (SSER) frameworks have not yet achieved satisfactory accuracy. In this work, we present accurate table-based cell models, based on which a Monte Carlo SSER analysis framework is built. We further propose a heuristic to customize the use of quasirandom sequences, which successfully speeds up the convergence of simulation error and hence shortens the runtime. Experimental results show that this framework is capable of more precisely estimating circuit SSERs with reasonable speed.
UR - http://www.scopus.com/inward/record.url?scp=77952606720&partnerID=8YFLogxK
U2 - 10.1109/ISQED.2010.5450485
DO - 10.1109/ISQED.2010.5450485
M3 - Conference contribution
AN - SCOPUS:77952606720
SN - 9781424464555
T3 - Proceedings of the 11th International Symposium on Quality Electronic Design, ISQED 2010
SP - 831
EP - 838
BT - Proceedings of the 11th International Symposium on Quality Electronic Design, ISQED 2010
Y2 - 22 March 2010 through 24 March 2010
ER -