Abnormal hump in capacitance-voltage measurements induced by ultraviolet light in a-IGZO thin-film transistors

Yu Ching Tsao, Ting Chang Chang*, Hua Mao Chen, Bo Wei Chen, Hsiao Cheng Chiang, Guan Fu Chen, Yu Chieh Chien, Ya-Hsiang Tai, Yu Ju Hung, Shin Ping Huang, Chung Yi Yang, Wu-Ching Chou

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

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Physics & Astronomy