A Unified Flicker Noise Model for FDSOI MOSFETs Including Back-bias Effect

Pragya Kushwaha, Harshit Agarwal, Chetan Kumar Dabhi, Yen Kai Lin, J. P. Duarte, Chen-Ming Hu, Yogesh Singh Chauhan

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Fingerprint Dive into the research topics of 'A Unified Flicker Noise Model for FDSOI MOSFETs Including Back-bias Effect'. Together they form a unique fingerprint.

Engineering & Materials Science