Abstract
A unified theoretical approach is presented for the double injection current-voltage characteristics of a solid with traps uniformly and non-uniformly distributed in the energy band gap. The current-voltage characteristics for various forms of trap distribution functions have been computed for a typical wide-gap semiconductor, and these are discussed in the light of presently available results.
Original language | English |
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Pages (from-to) | 407-415 |
Number of pages | 9 |
Journal | Solid State Electronics |
Volume | 16 |
Issue number | 3 |
DOIs | |
State | Published - 1 Jan 1973 |