A unified approach to detecting crosstalk faults of interconnects in deep sub-micron VLSI

Katherine Shu Min Li*, Chung Len Lee, Chau-Chin Su, Jwu E. Chen

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

12 Scopus citations

Abstract

The crosstalk fault effects in deep sub-micron VLSI, namely, glitches and the crosstalk-induced delay, are investigated. The origin of their occurrence, relationship and importance in circuit operation are elucidated. It is shown that the crosstalk-induced delay is only superposition of the induced glitch with the original signal delay on the affected victim line; and crosstalk-induced delay is more important in affecting the circuit performance, and should be considered in more details for testing. A scheme which is to detect both types of faults in a unified way by just detecting glitches is proposed and studied considering the manufacture process variation. In this way, detection of crosstalk-induced faults becomes much easier.

Original languageEnglish
Pages (from-to)145-150
Number of pages6
JournalProceedings of the Asian Test Symposium
DOIs
StatePublished - 1 Dec 2004
EventProceedings of the Asian Test Symposium, ATS'04 - Kenting, Taiwan
Duration: 15 Nov 200417 Nov 2004

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