A study on the design of a testable Fleischer-Laker switched-capacitor biquad

Shao Feng Hung*, Long Yi Lin, Hao-Chiao Hong

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

The Fleischer-Laker Switched-Capacitor (SC) biquad is a versatile building block for implementing analog filters. This paper studies how to design a testable Fleischer-Laker SC biquad based on the static linear behavior (SLB) analog fault model. In particular, we focus on how to achieve a 100% parametric fault coverage without sacrificing the design flexibility. We suggest not to use the capacitors L, K, and J in the most generalized Fleischer-Laker biquad so as to achieve a 100% parametric fault coverage defined by the SLB analog fault model.

Original languageEnglish
Title of host publicationProceedings of the 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop, IMS3TW 2012
Pages119-122
Number of pages4
DOIs
StatePublished - 6 Nov 2012
Event2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop, IMS3TW 2012 - Taipei, Taiwan
Duration: 14 May 201216 May 2012

Publication series

NameProceedings of the 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop, IMS3TW 2012

Conference

Conference2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop, IMS3TW 2012
CountryTaiwan
CityTaipei
Period14/05/1216/05/12

Keywords

  • Analog fault model
  • Fleischer-Laker biquad
  • Switched-capacitor circuits

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