A stochastic-based efficient critical area extractor on openaccess platform

Bo Zhou Chen, Hung-Ming Chen, Li Da Huang, Po Cheng Pan

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Due to inefficient calculation in current critical area analyzer, in this work we present a method of extracting critical area for short faults from the mask layout of an integrated circuit. The method is based on the concept of sampling framework and the geometry computation of critical area. By constructing the density table of layout, our weighted sampling approach can be more efficient, thus more suitable for the larger layout. The algorithm has been implemented on OpenAccess platform to allow efficient extraction of the critical area from an arbitrary mask layout. The results show that this method can reduce computation cost, and can still maintain the accuracy at the same time.

Original languageEnglish
Title of host publicationGLSVLSI 2009 - Proceedings of the 2009 Great Lakes Symposium on VLSI
Pages197-202
Number of pages6
DOIs
StatePublished - 6 Nov 2009
Event19th ACM Great Lakes Symposium on VLSI, GLSVLSI '09 - Boston, MA, United States
Duration: 10 May 200912 May 2009

Publication series

NameProceedings of the ACM Great Lakes Symposium on VLSI, GLSVLSI

Conference

Conference19th ACM Great Lakes Symposium on VLSI, GLSVLSI '09
CountryUnited States
CityBoston, MA
Period10/05/0912/05/09

Keywords

  • Critical Area Analysis
  • Open Access

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