A statistical performance simulation methodology for VLSI circuits

Michael Orshansky, James C. Chen, Chen-Ming Hu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

8 Scopus citations

Abstract

A statistical performance simulation (SPS) methodology for VLSI circuits is presented. Traditional methods of worst-case corner analysis lack accuracy and Monte-Carlo simulations cannot be applied to VLSI circuits because of their complexity. SPS methodology is accurate because no statistical information about the device parameter variation is lost. It achieves efficiency by analyzing the smaller circuit blocks and generating the performance distribution for the entire circuit. Circuit evaluation at any specified performance level is possible.

Original languageEnglish
Title of host publicationProceedings 1998 - Design and Automation Conference, DAC 1998
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages402-407
Number of pages6
ISBN (Print)078034409X
DOIs
StatePublished - 1 Jan 1998
Event35th Design and Automation Conference, DAC 1998 - San Francisco, United States
Duration: 15 Jun 199819 Jun 1998

Publication series

NameProceedings - Design Automation Conference
ISSN (Print)0738-100X

Conference

Conference35th Design and Automation Conference, DAC 1998
CountryUnited States
CitySan Francisco
Period15/06/9819/06/98

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