A service level model for the control wafers safety inventory problem

Shu Hsing Chung, He Yau Kang, W.l. Pearn

Research output: Contribution to journalArticle

4 Scopus citations

Abstract

This paper considers the control wafers safety inventory problem (CWSIP) in the wafer fabrication photolithography area. The objective is to minimize the total cost of control wafers, where the cost includes new wafers cost, re-entrant cost and holding cost while maintaining the same level of production throughput. For the problem under pulling control production environment, a nonlinear programming model is presented to set safety inventory levels so as to minimize total cost of control wafers. A numerical example is given to illustrate the practicality of the model. The results demonstrate that the proposed model is an effective tool for determining the service level of safety inventory of control wafers for each grade.

Original languageEnglish
Pages (from-to)591-597
Number of pages7
JournalInternational Journal of Advanced Manufacturing Technology
Volume26
Issue number5-6
DOIs
StatePublished - 1 Sep 2005

Keywords

  • Control wafers
  • Nonlinear programming model
  • Pull control
  • Safety inventory
  • Service level

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