TY - GEN
T1 - A serial scan test vector compression methodology
AU - Su, Chau-Chin
AU - Hwang, Kychin
PY - 1993/12/1
Y1 - 1993/12/1
N2 - This paper presents a serial scan test vector compression methodology for the test time reduction in a scan-based test environment. The reduction is achieved by the overlapping of two consecutive vectors. Hence, the order of test vectors determines the amount of reduction in time. Here, two test vector ordering algorithms, depth first greedy and coalesced simple orders algorithms, have been derived, implemented, and tested. Experimental results obtained are very close to estimations by statistical analysis.
AB - This paper presents a serial scan test vector compression methodology for the test time reduction in a scan-based test environment. The reduction is achieved by the overlapping of two consecutive vectors. Hence, the order of test vectors determines the amount of reduction in time. Here, two test vector ordering algorithms, depth first greedy and coalesced simple orders algorithms, have been derived, implemented, and tested. Experimental results obtained are very close to estimations by statistical analysis.
UR - http://www.scopus.com/inward/record.url?scp=0027883903&partnerID=8YFLogxK
U2 - 10.1109/TEST.1993.470601
DO - 10.1109/TEST.1993.470601
M3 - Conference contribution
AN - SCOPUS:0027883903
SN - 0780314298
T3 - Proceedings of the International Test Conference
SP - 981
EP - 988
BT - Proceedings of the International Test Conference
A2 - Anon, null
PB - Publ by IEEE
Y2 - 17 October 1993 through 21 October 1993
ER -