A SC/OFDM dual mode frequency-domain equalizer for 60GHz multi-gbps wireless transmission

Fu Chun Yeh*, Tai Yang Liu, Ting Chen Wei, Wei Chang Liu, Shyh-Jye Jou

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

13 Scopus citations

Abstract

This work proposes an adaptive frequency-domain equalizer (FDE) for single carrier and OFDM indoor over Gbps data rate wireless receiver. System simulation and specifications are based on the IEEE 802.15.3c standard. The proposed LS-LMS FDE uses low computational complexity Least-Mean-Square (LMS) algorithm with Least-Square (LS) channel estimation to accelerate the convergence speed. The FDE can be used for dual mode (SC and HSI) Wireless Personal Area Networks (WPAN) system. The simulation results show that the LS-LMS FDE can achieve 1.32*10-4 BER in SC mode and 6.55*10-3 in HSI mode (both uncoded) at SNR 14 dB. The total area is about 415K gate-count with 69% shared among single carrier and OFDM mode except 2 FFT. The power consumption is only 81.27 mW when working at 400MHz.

Original languageEnglish
Title of host publicationProceedings of 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011
Pages406-409
Number of pages4
DOIs
StatePublished - 28 Jun 2011
Event2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011 - Hsinchu, Taiwan
Duration: 25 Apr 201128 Apr 2011

Publication series

NameProceedings of 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011

Conference

Conference2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011
CountryTaiwan
CityHsinchu
Period25/04/1128/04/11

Keywords

  • Adaptive frequency-domain equalizer
  • Channel estimation
  • Dual mode
  • LMS
  • LS

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    Yeh, F. C., Liu, T. Y., Wei, T. C., Liu, W. C., & Jou, S-J. (2011). A SC/OFDM dual mode frequency-domain equalizer for 60GHz multi-gbps wireless transmission. In Proceedings of 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011 (pp. 406-409). [5783559] (Proceedings of 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011). https://doi.org/10.1109/VDAT.2011.5783559