A scalable noise De-embedding technique for on-wafer microwave device characterization

Ming Hsiang Cho*, Guo Wei Huang, Yueh Hua Wang, Lin-Kun Wu

*Corresponding author for this work

Research output: Contribution to journalArticle

24 Scopus citations

Abstract

In this letter, we present a scalable and efficient noise de-embedding procedure, which is based on transmission-line theory and cascade configurations, for on-wafer microwave measurements of silicon MOSFETs. The proposed de-embedding procedure utilizes one open and one thru dummy structures to eliminate the parasitic effects from the probe pads and the input/output interconnects of a device-under-test (DUT), respectively. This method can generate the scalable distributed interconnect parameters to efficiently and precisely remove the redundant parasitics of the DUTs with various device sizes and arbitrary interconnect dimensions.

Original languageEnglish
Pages (from-to)649-651
Number of pages3
JournalIEEE Microwave and Wireless Components Letters
Volume15
Issue number10
DOIs
StatePublished - 1 Oct 2005

Keywords

  • Calibration
  • De-embedding
  • MOSFET
  • Noise
  • S-parameters

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