A review of domain modelling and domain imaging techniques in ferroelectric crystals

Prashant R. Potnis, Nien-Ti Tsou, John E. Huber*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

63 Scopus citations

Abstract

The present paper reviews models of domain structure in ferroelectric crystals, thin films and bulk materials. Common crystal structures in ferroelectric materials are described and the theory of compatible domain patterns is introduced. Applications to multi-rank laminates are presented. Alternative models employing phase-field and related techniques are reviewed. The paper then presents methods of observing ferroelectric domain structure, including optical, polarized light, scanning electron microscopy, X-ray and neutron diffraction, atomic force microscopy and piezo-force microscopy. Use of more than one technique for unambiguous identification of the domain structure is also described.

Original languageEnglish
Pages (from-to)417-447
Number of pages31
JournalMaterials
Volume4
Issue number2
DOIs
StatePublished - 1 Jan 2010

Keywords

  • Characterization techniques
  • Microstructure
  • Single crystals ferroelectrics

Fingerprint Dive into the research topics of 'A review of domain modelling and domain imaging techniques in ferroelectric crystals'. Together they form a unique fingerprint.

Cite this