A Pattern Deformational Model and Bayes Error-Correcting Recognition System

Wen-Hsiang Tsai, King Sun Fu

Research output: Contribution to journalArticlepeer-review

18 Scopus citations

Abstract

A pattern deformational model is proposed in this paper. Pattern deformations are categorized into two types: local deformation and structural deformation. A structure-preserving local deformation can be decomposed into a syntactic deformation followed by a semantic deformation, the former being induced on primitive structures and the latter on primitive properties. Bayes error-correcting parsing algorithms are proposed accordingly which not only can perform normal syntax analysis but also can make statistical decisions. An optimum Bayes error-correcting recognition system is then formulated for pattern classification. The system can be considered as a hybrid pattern classifier which uses both syntactic and statistical pattern recognition techniques.

Original languageEnglish
Pages (from-to)745-756
Number of pages12
JournalIEEE Transactions on Systems, Man and Cybernetics
Volume9
Issue number12
DOIs
StatePublished - 1 Jan 1979

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