A Novel Method of Electrical Measurement for Stacking Error in 3D/2.5D Integration

Shih Wei Lee, Shu Chiao Kuo, Kuan-Neng Chen

Research output: Contribution to journalArticlepeer-review

Abstract

A novel method for the inspection of the stacking misalignment in three-dimensional integration circuit (3DIC) by using electrical measurement is proposed. The metal line pattern designed in this paper combined with bump-less TSV fabrication process can successfully detect the direction and quantity of stacking fault. In addition, circuit combined with testing structure can be developed and simulated by using the current mirror concept and offered measurements with better efficiency.
Original languageAmerican English
Pages (from-to)1066-1069
JournalJournal of Nanoscience and Nanotechnology
Volume18
Issue number2
DOIs
StatePublished - Feb 2018

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