A novel LCD driver testing technique using logic test channels

Chau-Chin Su, Wei Juo Wang, Chih Hu Wang, I. S. Tseng

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

This paper proposes a novel voltage measurement technique for LCD driver testing by the use of the logic test channel of an ATE. The method is able to achieve less than 1 mV error with the presence of 32 mV RMS noise.

Original languageEnglish
Title of host publicationProceedings of the ASP-DAC 2003 Asia and South Pacific Design Automation Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages657-662
Number of pages6
ISBN (Electronic)0780376595
DOIs
StatePublished - 1 Jan 2003
EventAsia and South Pacific Design Automation Conference, ASP-DAC 2003 - Kitakyushu, Japan
Duration: 21 Jan 200324 Jan 2003

Publication series

NameProceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
Volume2003-January

Conference

ConferenceAsia and South Pacific Design Automation Conference, ASP-DAC 2003
CountryJapan
CityKitakyushu
Period21/01/0324/01/03

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