A note on production yield measure for multiple lines

W.l. Pearn, Y. T. Tai*, Chia-Huang Wu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

7 Scopus citations


In today’s globally competitive environment, processes involving multiple manufacturing lines are quite common due to economies of scale considerations. Production yield measure indices Cpk and Cpu are the most popular yield-based indices and have been widely used in manufacturing industries for two-sided and one-sided specification limits, respectively. In this paper, two production yield indices for multiple lines (Formula presented.) and (Formula presented.) are considered and the approximate distributions of two natural estimators (Formula presented.) and (Formula presented.) are derived. For the convenience of industry applications, the lower confidence bounds and critical values are provided.

Original languageEnglish
Pages (from-to)394-402
Number of pages9
JournalQuality Technology and Quantitative Management
Issue number4
StatePublished - 1 Oct 2016


  • Capability index
  • critical value
  • lower confidence bound
  • multiple manufacturing lines
  • production yield

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