A note on "capability assessment for processes with multiple characteristics: A generalization of the popular index Cpk"

W.l. Pearn, Chia-Huang Wu*, M. C. Tsai

*Corresponding author for this work

Research output: Contribution to journalArticle

23 Scopus citations

Abstract

The generalized yield index CpkT establishes the relationship between the manufacturing specifications and the actual process performance, which provides a lower bound on process yield for two-sided processes with multiple characteristics. The results attended are very practical for industrial application. In this article, we extended the results in cases with one-sided specification and multiple characteristics. The generalized index CPUT was considered, and the asymptotic distribution of the natural estimator C^PUT was developed. Then, we derived the lower confidence bounds as well as the critical values of index CPUT. We not only provided some tables but also presented an application example.

Original languageEnglish
Pages (from-to)159-163
Number of pages5
JournalQuality and Reliability Engineering International
Volume29
Issue number2
DOIs
StatePublished - 1 Mar 2013

Keywords

  • critical values
  • lower confidence bounds
  • multiple characteristics
  • one-sided specification
  • process capability index

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