Abstract
A new Schmitt trigger circuit, which is implemented by low-voltage devices to receive the high-voltage input signals without gate-oxide reliability problem, is proposed. The new proposed circuit, which can be operated in a 3.3-V signal environment without suffering high-voltage gate-oxide overstress, has been fabricated in a 0.13-μm 1/2.5-V 1P8M CMOS process. The experimental results have confirmed that the measured transition threshold voltages of the new proposed Schmitt trigger circuit are about 1 and 2.5 V, respectively. The new proposed Schmitt trigger circuit is suitable for mixed-voltage input-output interfaces to receive input signals and reject input noise.
Original language | English |
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Pages (from-to) | 361-365 |
Number of pages | 5 |
Journal | IEEE Transactions on Circuits and Systems I: Regular Papers |
Volume | 52 |
Issue number | 7 |
DOIs | |
State | Published - 5 Jul 2005 |
Keywords
- Gate-oxide reliability
- input-output (I/O)
- mixed-voltage interface
- Schmitt trigger