A New Schmitt Trigger Circuit in a 0.13-μm 1/2.5-V CMOS Process to Receive 3.3-V Input Signals

Shih Lun Chen, Ming-Dou Ker

Research output: Contribution to journalArticle

45 Scopus citations

Abstract

A new Schmitt trigger circuit, which is implemented by low-voltage devices to receive the high-voltage input signals without gate-oxide reliability problem, is proposed. The new proposed circuit, which can be operated in a 3.3-V signal environment without suffering high-voltage gate-oxide overstress, has been fabricated in a 0.13-μm 1/2.5-V 1P8M CMOS process. The experimental results have confirmed that the measured transition threshold voltages of the new proposed Schmitt trigger circuit are about 1 and 2.5 V, respectively. The new proposed Schmitt trigger circuit is suitable for mixed-voltage input-output interfaces to receive input signals and reject input noise.

Original languageEnglish
Pages (from-to)361-365
Number of pages5
JournalIEEE Transactions on Circuits and Systems II: Express Briefs
Volume52
Issue number7
DOIs
StatePublished - 5 Jul 2005

Keywords

  • Gate-oxide reliability
  • input-output (I/O)
  • mixed-voltage interface
  • Schmitt trigger

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