A new prediction model on the luminance of OLEDs subjected to different reverse biases for alleviating degradation in AMOLED displays

Ming Hung Yu, Trong Hieu Tran, Yen Ping Hsu, Chang-Po Chao*, Kuei Yu Lee, Yung Hua Kao

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

A new prediction model for estimating luminance degradation of an OLED subjected to varied combinations of forward and reverse biases is proposed. To this end, the known increase in the voltage of OLEDs under long-time operation versus degraded emitted luminance is first-time ever considered to identify the degradation exponent as logarithm functions of elapsed time. With the identified degradation versus time, the degraded OLED luminance can be well predicted even subjected to varied combinations of forward and reverse biases. The established model is particularly useful for achieving required lifetime of modern AMOLED displays. Based on the model in terms of equations, the OLED parameters including forward, reverse bias stresses, and initial luminance can be applied to the model to accurately estimate the luminance variation during long-time operation. The estimation error between model predictions and experimental measurements is less than 1.6 %.

Original languageEnglish
Pages (from-to)2771-2776
Number of pages6
JournalMicrosystem Technologies
Volume21
Issue number12
DOIs
StatePublished - 30 Apr 2015

Fingerprint Dive into the research topics of 'A new prediction model on the luminance of OLEDs subjected to different reverse biases for alleviating degradation in AMOLED displays'. Together they form a unique fingerprint.

Cite this